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Knowledge Base

Calculates the fields within a multilayer stack illuminated from below by a plane wave using the analytic transfer matrix method. This function returns the E and H fields (Es, Ep, Hs, Hp). All results are returned in a single dataset as a function of frequency, incidence angle and location in the stack (z).


Note: Thickness of first and last layer

It is necessary to specify the thickness of each layer, including the first and last layers. Often, a thickness of zero can be used for these layers, meaning the results will be calculated just beyond the first and last interface. If a larger value is used, the results will be calculated further from the interface. For non-lossy materials, this will not affect the reflected and transmitted power, but it will change phase of the complex coefficients.



This script command was introduced in the 2016b release.






field = stackfield(n,d,f);

Arguments for a stack with Nlayers:

n: Refractive index of each layer. Size is either Nlayers, or Nlayers x length(f) if dispersive materials are involved.

d: Thickness of each layer. Size is Nlayers.

f: Frequency vector.

field = stackfield(n,d,f,theta,res);

theta: Angle vector, in degrees. Optional, default is 0.

res: resolution in the field result returned. Optional, default is 1000.

field = stackfield(n,d,f,theta,res,min,max);

min/max: the min/max position where the user wishes to compute the field. 0 corresponds to the bottom of the stack. Optional, default is the span of the multilayer stack.



See stackrt.


See Also

Functions, stackrt, Stack optical solver, getfdtdindex, visualize, stackdipole

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